Shape effects in elastic scattering by orientationally random ensembles of simple model viruses

Biopolymers ◽  
1987 ◽  
Vol 26 (12) ◽  
pp. 2027-2040 ◽  
Author(s):  
W. M. McClain ◽  
W. A. Ghoul
Keyword(s):  
Simple Model ◽  
Elastic Scattering ◽  
Shape Effects

Shape effects in heavy ion (Li) elastic scattering

1978 ◽  
Vol 78 (1) ◽  
pp. 36-40 ◽  
Author(s):  
W. Dreves ◽  
P. Zupranski ◽  
P. Egelhof ◽  
D. Kassen ◽  
E. Steffens ◽  
...  
Keyword(s):  
Elastic Scattering ◽  
Heavy Ion ◽  
Shape Effects

Simple model of pion-nucleon elastic scattering

1980 ◽  
Vol 22 (2) ◽  
pp. 651-663 ◽  
Author(s):  
D. J. Ernst ◽  
Mikkel B. Johnson
Keyword(s):  
Simple Model ◽  
Elastic Scattering ◽  
Pion Nucleon

Low energy o-Ps–o-Ps elastic scattering using a simple model

2009 ◽  
Vol 53 (2) ◽  
pp. 189-191 ◽  
Author(s):  
Himanshu Sharma ◽  
Kiran Kumari ◽  
Sumana Chakraborty
Keyword(s):  
Simple Model ◽  
Elastic Scattering ◽  
Low Energy

scholarly journals DYNAMICAL ENTANGLEMENT IN NON-RELATIVISTIC ELASTIC SCATTERING

2007 ◽  
Vol 05 (01n02) ◽  
pp. 273-278 ◽  
Author(s):  
N. L. HARSHMAN
Keyword(s):  
Simple Model ◽  
Elastic Scattering ◽  
Boundary Conditions ◽  
Global Symmetries ◽  
Relativistic Particle ◽  
Spin Systems ◽  
Particle Scattering ◽  
Full System

This article considers dynamical entanglement in non-relativistic particle scattering. Three questions are explored: what kinds of entanglement occur in this system, how do global symmetries constrain entanglement, and how do the boundary conditions of scattering affect dynamical entanglement? First, a simple model of scattering spin systems is considered, then the full system is discussed.

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

The Resolution and Contrast in Biological Sections Determined by Inelastic and Elastic Scattering

1973 ◽  
Vol 31 ◽  
pp. 224-225
Author(s):  
D. L. Misell
Keyword(s):  
Electron Microscopy ◽  
Adverse Effect ◽  
Elastic Scattering ◽  
Inelastic Scattering ◽  
Amorphous Carbon ◽  
Polymeric Materials ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Quantitative Estimates ◽  
Elastic Ratio

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.

A New Image Processing Technique for STEM

1974 ◽  
Vol 32 ◽  
pp. 432-433
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Scanning Electron Microscopy ◽  
Elastic Scattering ◽  
Field Emission ◽  
Processing Technique ◽  
Image Processing Technique ◽  
Energy Analyzer ◽  
Scanning Microscope ◽  
Scanning Electron

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.

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