4U 1746-37: An ultra-low-mass compact star candidate

2015 ◽  
Vol 336 (8-9) ◽  
pp. 871-875
Author(s):  
Zhao-Sheng Li
Keyword(s):  
2018 ◽  
Vol 96 (6) ◽  
pp. 594-602 ◽  
Author(s):  
Piyali Bhar ◽  
Tuhina Manna ◽  
Farook Rahaman ◽  
Ayan Banerjee

In present paper a spherically symmetric stellar configuration has been analyzed by assuming the matter distribution of the stellar configuration is anisotropic in nature and compared with the realistic objects, namely, the low mass X-ray binaries and X-ray pulsars. The analytic solution has been obtained by utilizing the dark energy equation of state for the interior solution corresponding to the Schwarzschild exterior vacuum solution at the junction interface. Several physical properties, like energy conditions, stability, mass–radius ratio, and surface redshift, are described through mathematical calculations as well as graphical plots. It is found that obtained mass–radius ratios of the compact star candidates like 4U 1820–30, PSR J 1614–2230, Vela X-1, and Cen X-3 are very much consistent with the observed data by Gangopadhyay et al. (Mon. Not. R. Astron. Soc. 431, 3216 (2013)). So our proposed model would be useful in the investigation of the possible clustering of dark energy.


2019 ◽  
Vol 19 (2) ◽  
pp. 026
Author(s):  
Sajahan Molla ◽  
Rabiul Islam ◽  
Md. Abdul Kayum Jafry ◽  
Mehedi Kalam

1988 ◽  
Vol 102 ◽  
pp. 47-50
Author(s):  
K. Masai ◽  
S. Hayakawa ◽  
F. Nagase

AbstractEmission mechanisms of the iron Kα-lines in X-ray binaries are discussed in relation with the characteristic temperature Txof continuum radiation thereof. The 6.7 keV line is ascribed to radiative recombination followed by cascades in a corona of ∼ 100 eV formed above the accretion disk. This mechanism is attained for Tx≲ 10 keV as observed for low mass X-ray binaries. The 6.4 keV line observed for binary X-ray pulsars with Tx> 10 keV is likely due to fluorescence outside the He II ionization front.


2020 ◽  
Author(s):  
Jürgen Schaffner-Bielich
Keyword(s):  

2002 ◽  
Author(s):  
M. E. D. Urso ◽  
V.V. Wadekar ◽  
Geoffrey F. Hewitt
Keyword(s):  

Author(s):  
Yongkai Zhou ◽  
Jie Zhu ◽  
Han Wei Teo ◽  
ACT Quah ◽  
Lei Zhu ◽  
...  

Abstract In this paper, two failure analysis case studies are presented to demonstrate the importance of sample preparation procedures to successful failure analyses. Case study 1 establishes that Palladium (Pd) cannot be used as pre-FIB coating for SiO2 thickness measurement due to the spontaneously Pd silicide formation at the SiO2/Si interface. Platinum (Pt) is thus recommended, in spite of the Pt/SiO2 interface roughness, as the pre-FIB coating in this application. In the second case study, the dual-directional TEM inspection method is applied to characterize the profile of the “invisible” tungsten residue defect. The tungsten residue appears invisible in the planeview specimen due to the low mass-thickness contrast. It is then revealed in the cross-sectional TEM inspection.


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