Sensitivity of surface free energy analysis methods to the contact angle changes attributed to the thickness effect in thin films

2004 ◽  
Vol 93 (4) ◽  
pp. 1972-1980 ◽  
Author(s):  
A. Abbasian ◽  
S. R. Ghaffarian ◽  
N. Mohammadi ◽  
D. Fallahi
2013 ◽  
Vol 282 ◽  
pp. 714-717 ◽  
Author(s):  
C.M. González-García ◽  
S. Román ◽  
J.F. González ◽  
E. Sabio ◽  
B. Ledesma

2012 ◽  
Vol 40 (1) ◽  
pp. 103618 ◽  
Author(s):  
M. R. Mitchell ◽  
R. E. Link ◽  
Aravinda Buddhala ◽  
Zahid Hossain ◽  
Nazimuddin M. Wasiuddin ◽  
...  

2011 ◽  
Vol 1360 ◽  
Author(s):  
Kazuhiro Fukada ◽  
Hayato Sakai ◽  
Taku Hasobe ◽  
Takashi Masuda ◽  
Tatsuya Shimoda

ABSTRACTWe measured the surface free energy of a substrate by transmission electron microscopy (TEM) using sub-millimetre-sized inkjet droplets. By employing two types of TEM grids with different surface free energies, we investigated the relationship between the surface energy and the patterns of an organic solution dried on the grids. We confirmed that the generation of the porphyrin hexamer [(H2PAC15)6TPh] patterns was affected by the surface free energy of the TEM grid.


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