Surface characterization of hydrophilic functional polymer latex particles

1989 ◽  
Vol 38 (3) ◽  
pp. 403-412 ◽  
Author(s):  
H. Tamai ◽  
M. Hasegawa ◽  
T. Suzawa
Keyword(s):  
Surface Characterization ◽  
Latex Particles ◽  
Functional Polymer ◽  
Polymer Latex

The Application of Time-of-Flight SIMS for the Surface Characterization of Polymer Latex Particles Prepared with Immobilized Sugar Residues

1993 ◽  
Vol 161 (1) ◽  
pp. 83-90 ◽  
Author(s):  
M.C. Davies ◽  
R.A.P. Lynn ◽  
S.S. Davis ◽  
J. Hearn ◽  
J.C. Vickerman ◽  
...  
Keyword(s):  
Surface Characterization ◽  
Time Of Flight ◽  
Latex Particles ◽  
Polymer Latex

Surface characterization of styrene/acrylamide copolymer latex particles

1985 ◽  
Vol 30 (9) ◽  
pp. 3857-3866 ◽  
Author(s):  
H. Tamai ◽  
T. Murakami ◽  
T. Suzawa
Keyword(s):  
Surface Characterization ◽  
Latex Particles

Thiol-terminated hydroxy-functional polymer as a transtab toward polymer latex particles

2012 ◽  
Vol 291 (5) ◽  
pp. 1171-1180 ◽  
Author(s):  
Syuji Fujii ◽  
Shinji Yamashita ◽  
Yuichi Kakigi ◽  
Kodai Aono ◽  
Sho Hamasaki ◽  
...  
Keyword(s):  
Latex Particles ◽  
Functional Polymer ◽  
Polymer Latex

Synthesis and characterization of hollow polymer latex particles

1997 ◽  
Vol 8 (11) ◽  
pp. 627-630 ◽  
Author(s):  
Xiang-Zheng Kong ◽  
Cheng-You Kan ◽  
Hui-Hui Li ◽  
Dai-Qing Yu ◽  
Qing Yuan
Keyword(s):  
Synthesis And Characterization ◽  
Latex Particles ◽  
Polymer Latex

In situ Structural Characterization of Semi-Crystalline Polymer Latex Particles by Small-Angle X-Ray Scattering

2004 ◽  
Vol 205 (2) ◽  
pp. 165-172 ◽  
Author(s):  
Joerg Bolze ◽  
Matthias Ballauff ◽  
Thorsten Rische ◽  
Daniel Rudhardt ◽  
Jürgen Meixner
Keyword(s):  
Structural Characterization ◽  
Small Angle ◽  
Crystalline Polymer ◽  
Latex Particles ◽  
X Ray ◽  
X Ray Scattering ◽  
Polymer Latex ◽  
Ray Scattering

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Sign in / Sign up

Export Citation Format

Share Document