On‐Wafer Crystallization of Ultralow‐κPure Silica Zeolite Films

2009 ◽  
Vol 121 (26) ◽  
pp. 4871-4874 ◽  
Author(s):  
Yan Liu ◽  
Christopher M. Lew ◽  
Minwei Sun ◽  
Rui Cai ◽  
Junlan Wang ◽  
...  
Keyword(s):  
2008 ◽  
Vol 47 (11) ◽  
pp. 8360-8363 ◽  
Author(s):  
Yoshinori Cho ◽  
Toshiki Seo ◽  
Kazuo Kohmura ◽  
Takamaro Kikkawa

2007 ◽  
Author(s):  
T. Seo ◽  
T. Yoshino ◽  
N. Ohnuki ◽  
Y. Seino ◽  
N. Hata ◽  
...  

Langmuir ◽  
2011 ◽  
Vol 27 (7) ◽  
pp. 3283-3285 ◽  
Author(s):  
Christopher M. Lew ◽  
Yan Liu ◽  
David Kisailus ◽  
Grant M. Kloster ◽  
Gabriel Chow ◽  
...  

2001 ◽  
Vol 13 (19) ◽  
pp. 1463-1466 ◽  
Author(s):  
Z. B. Wang ◽  
A. Mitra ◽  
H. T. Wang ◽  
L. M. Huang ◽  
Y. Yan

Sensors ◽  
2021 ◽  
Vol 21 (12) ◽  
pp. 3947
Author(s):  
Wei Wang ◽  
Qinyi Zhang ◽  
Ruonan Lv ◽  
Dong Wu ◽  
Shunping Zhang

High performance formaldehyde gas sensors are widely needed for indoor air quality monitoring. A modified layer of zeolite on the surface of metal oxide semiconductors results in selectivity improvement to formaldehyde as gas sensors. However, there is insufficient knowledge on how the thickness of the zeolite layer affects the gas sensing properties. In this paper, ZSM-5 zeolite films were coated on the surface of the SnO2 gas sensors by the screen printing method. The thickness of ZSM-5 zeolite films was controlled by adjusting the numbers of screen printing layers. The influence of ZSM-5 film thickness on the performance of ZSM-5/SnO2 gas sensors was studied. The results showed that the ZSM-5/SnO2 gas sensors with a thickness of 19.5 μm greatly improved the selectivity to formaldehyde, and reduced the response to ethanol, acetone and benzene at 350 °C. The mechanism of the selectivity improvement to formaldehyde of the sensors was discussed.


Author(s):  
Jingmin Lan ◽  
Peiwen Liu ◽  
Ping Fu ◽  
Xiaoling Liu ◽  
Menglin Xie ◽  
...  
Keyword(s):  

2020 ◽  
Vol 1008 ◽  
pp. 33-38
Author(s):  
Marwa Nabil ◽  
Hussien A. Motaweh

Silica is one of the most important materials used in many industries. The basic factor on which the selection process depends is the structural form, which is dependent on the various physical and chemical properties. One of the common methods in preparing pure silica is that it needs more than one stage to ensure the preparation process completion. The goal of this research is studying the nucleation technique (Bottom-top) for micro-wires and micro-ribbons silica synthesis. The silica nanoand microstructures are prepared using a duality (one step); a combination of alkali chemical etching process {potassium hydroxide (3 wt %) and n-propanol (30 Vol %)} and the ultra-sonication technique. In addition, the used materials in the preparation process are environmentally friendly materials that produce no harmful residues. The powder product is characterized using XRD, FTIR, Raman spectrum and SEM for determining the shape of architectures. The most significant factor of the nucleation mechanism is the sonication time of silica powder production during the dual technique. The product stages are as follows; silica nanoparticles (21-38 nm), nanoclusters silica (46 – 67 nm), micro-wires silica (1.17 – 6.29 μm), and micro-ribbons silica (19.4 – 54.1 μm). It's allowing for use in environmental applications (multiple wastewater purification, multiple uses in air filters, as well as many industrial applications).


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