Evaluation of Charged Defect Energy in Two‐Dimensional Semiconductors for Nanoelectronics: The WLZ Extrapolation Method
2000 ◽
Vol 112
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pp. 49-61
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1993 ◽
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pp. 735-741
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2001 ◽
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pp. 15-34
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2015 ◽
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pp. 926-948
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pp. 487-493
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