Evaluation of Charged Defect Energy in Two‐Dimensional Semiconductors for Nanoelectronics: The WLZ Extrapolation Method

2020 ◽  
Vol 532 (3) ◽  
pp. 1900318
Author(s):  
Sha Xia ◽  
Dan Wang ◽  
Nian‐Ke Chen ◽  
Dong Han ◽  
Xian‐Bin Li ◽  
...  
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