Benchmarking β‐Ga
2
O
3
Schottky Diodes by Nanoscale Ballistic Electron Emission Microscopy
1992 ◽
Vol 10
(2)
◽
pp. 580
◽
1996 ◽
Vol 14
(2)
◽
pp. 617
◽
1993 ◽
Vol 70-71
◽
pp. 391-395
◽
2001 ◽
Vol 66
(1-2)
◽
pp. 3-51
◽
1992 ◽
Vol 10
(6)
◽
pp. 3112
◽