scholarly journals Two-Dimensional Materials: Nanomechanical Properties of Epitaxial Silicene Revealed by Noncontact Atomic Force Microscopy (Adv. Mater. Interfaces 2/2019)

2019 ◽  
Vol 6 (2) ◽  
pp. 1970014
Author(s):  
Makoto Nogami ◽  
Antoine Fleurence ◽  
Yukiko Yamada-Takamura ◽  
Masahiko Tomitori
Keyword(s):  
Atomic Force Microscopy ◽  
Two Dimensional ◽  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Atomic Force ◽  
Two Dimensional Materials

Corrigendum to “Atomic force microscopy for two-dimensional materials: A tutorial review” [Opt. Commun. 406 (2018) 3–17]

2018 ◽  
Vol 421 ◽  
pp. 134
Author(s):  
Hang Zhang ◽  
Junxiang Huang ◽  
Yongwei Wang ◽  
Rui Liu ◽  
Xiulan Huai ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Two Dimensional ◽  
Force Microscopy ◽  
Atomic Force ◽  
Two Dimensional Materials

scholarly journals A benzoxazine surfactant exchange for atomic force microscopy characterization of two dimensional materials exfoliated in aqueous surfactant solutions

RSC Advances ◽  
2017 ◽  
Vol 7 (6) ◽  
pp. 3222-3228 ◽  
Author(s):  
Tao Wang ◽  
Matthew D. J. Quinn ◽  
Shannon M. Notley
Keyword(s):  
Atomic Force Microscopy ◽  
Two Dimensional ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surfactant Solutions ◽  
Two Dimensional Materials ◽  
Liquid Phase Exfoliation ◽  
Microscopy Characterization ◽  
Atomic Force Microscopy Characterization

Surfactant exchange was utilized to successfully deposit 2D flakes from liquid phase exfoliation for AFM characterization.

Atomic force microscopy for two-dimensional materials: A tutorial review

2018 ◽  
Vol 406 ◽  
pp. 3-17 ◽  
Author(s):  
Hang Zhang ◽  
Junxiang Huang ◽  
Yongwei Wang ◽  
Rui Liu ◽  
Xiulan Huai ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Two Dimensional ◽  
Force Microscopy ◽  
Atomic Force ◽  
Two Dimensional Materials

scholarly journals Tip-Based Nanomachining on Thin Films: A Mini Review

2021 ◽  
Author(s):  
Shunyu Chang ◽  
Yanquan Geng ◽  
Yongda Yan
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Data Storage ◽  
Three Dimensional ◽  
Maintenance Cost ◽  
Two Dimensional ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current State ◽  
Two Dimensional Materials

AbstractAs one of the most widely used nanofabrication methods, the atomic force microscopy (AFM) tip-based nanomachining technique offers important advantages, including nanoscale manipulation accuracy, low maintenance cost, and flexible experimental operation. This technique has been applied to one-, two-, and even three-dimensional nanomachining patterns on thin films made of polymers, metals, and two-dimensional materials. These structures are widely used in the fields of nanooptics, nanoelectronics, data storage, super lubrication, and so forth. Moreover, they are believed to have a wide application in other fields, and their possible industrialization may be realized in the future. In this work, the current state of the research into the use of the AFM tip-based nanomachining method in thin-film machining is presented. First, the state of the structures machined on thin films is reviewed according to the type of thin-film materials (i.e., polymers, metals, and two-dimensional materials). Second, the related applications of tip-based nanomachining to film machining are presented. Finally, the current situation of this area and its potential development direction are discussed. This review is expected to enrich the understanding of the research status of the use of the tip-based nanomachining method in thin-film machining and ultimately broaden its application.

Nanomechanical properties of lithiated Si nanowires probed with atomic force microscopy

2012 ◽  
Vol 45 (27) ◽  
pp. 275301 ◽  
Author(s):  
Hyunsoo Lee ◽  
Weonho Shin ◽  
Jang Wook Choi ◽  
Jeong Young Park
Keyword(s):  
Atomic Force Microscopy ◽  
Si Nanowires ◽  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Atomic Force
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