Reduction in Modulus of Suspended Sub-2 nm Single Crystalline Silicon Nanomembranes

2017 ◽  
Vol 4 (19) ◽  
pp. 1700529 ◽  
Author(s):  
Xiaodong Zhu ◽  
Jiwu Lu ◽  
Haihua Pan ◽  
Zejie Zheng ◽  
Xiaodong Pi ◽  
...  
Keyword(s):  
Crystalline Silicon ◽  
Single Crystalline Silicon ◽  
Single Crystalline ◽  
Silicon Nanomembranes

scholarly journals Thickness‐Dependent Electronic Transport in Ultrathin, Single Crystalline Silicon Nanomembranes

2019 ◽  
Vol 5 (12) ◽  
pp. 1900917 ◽  
Author(s):  
Enming Song ◽  
Zhongxun Guo ◽  
Guodong Li ◽  
Fuyou Liao ◽  
Gongjin Li ◽  
...  
Keyword(s):  
Electronic Transport ◽  
Crystalline Silicon ◽  
Single Crystalline Silicon ◽  
Single Crystalline ◽  
Silicon Nanomembranes

Flexible Phototransistors Based on Single‐Crystalline Silicon Nanomembranes

2015 ◽  
Vol 4 (1) ◽  
pp. 120-125 ◽  
Author(s):  
Jung‐Hun Seo ◽  
Kan Zhang ◽  
Munho Kim ◽  
Deyin Zhao ◽  
Hongjun Yang ◽  
...  
Keyword(s):  
Crystalline Silicon ◽  
Single Crystalline Silicon ◽  
Single Crystalline ◽  
Silicon Nanomembranes

Bendable Photodetector on Fibers Wrapped with Flexible Ultrathin Single Crystalline Silicon Nanomembranes

2017 ◽  
Vol 9 (14) ◽  
pp. 12171-12175 ◽  
Author(s):  
Enming Song ◽  
Qinglei Guo ◽  
Gaoshan Huang ◽  
Bo Jia ◽  
Yongfeng Mei
Keyword(s):  
Crystalline Silicon ◽  
Single Crystalline Silicon ◽  
Single Crystalline ◽  
Silicon Nanomembranes

Thickness‐Dependent Electronic Transport in Ultrathin, Single Crystalline Silicon Nanomembranes

2019 ◽  
Vol 5 (7) ◽  
pp. 1900232 ◽  
Author(s):  
Enming Song ◽  
Zhongxun Guo ◽  
Guodong Li ◽  
Fuyou Liao ◽  
Gongjin Li ◽  
...  
Keyword(s):  
Electronic Transport ◽  
Crystalline Silicon ◽  
Single Crystalline Silicon ◽  
Single Crystalline ◽  
Silicon Nanomembranes

Dissolution Chemistry and Biocompatibility of Single-Crystalline Silicon Nanomembranes and Associated Materials for Transient Electronics

ACS Nano ◽  
2014 ◽  
Vol 8 (6) ◽  
pp. 5843-5851 ◽  
Author(s):  
Suk-Won Hwang ◽  
Gayoung Park ◽  
Chris Edwards ◽  
Elise A. Corbin ◽  
Seung-Kyun Kang ◽  
...  
Keyword(s):  
Crystalline Silicon ◽  
Single Crystalline Silicon ◽  
Single Crystalline ◽  
Silicon Nanomembranes ◽  
Transient Electronics

Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer

2013 ◽  
Vol 58 (2) ◽  
pp. 142-150 ◽  
Author(s):  
A.V. Sachenko ◽  
◽  
V.P. Kostylev ◽  
V.G. Litovchenko ◽  
V.G. Popov ◽  
...  
Keyword(s):  
Surface Layer ◽  
Crystalline Silicon ◽  
Silicon Wafers ◽  
Single Crystalline Silicon ◽  
Near Surface ◽  
Single Crystalline

Dynamic Crack Propagation in Single-Crystalline Silicon

1998 ◽  
Vol 539 ◽  
Author(s):  
T. Cramer ◽  
A. Wanner ◽  
P. Gumbsch
Keyword(s):  
Crack Propagation ◽  
Crystalline Silicon ◽  
Potential Drop ◽  
Tensile Tests ◽  
Terminal Velocity ◽  
Dynamic Crack Propagation ◽  
Dynamic Crack ◽  
Single Crystalline Silicon ◽  
Single Crystalline ◽  
Crack Propagation Velocity

AbstractTensile tests on notched plates of single-crystalline silicon were carried out at high overloads. Cracks were forced to propagate on {110} planes in a <110> direction. The dynamics of the fracture process was measured using the potential drop technique and correlated with the fracture surface morphology. Crack propagation velocity did not exceed a terminal velocity of v = 3800 m/s, which corresponds to 83%7 of the Rayleigh wave velocity vR. Specimens fractured at low stresses exhibited crystallographic cleavage whereas a transition from mirror-like smooth regions to rougher hackle zones was observed in case of the specimens fractured at high stresses. Inspection of the mirror zone at high magnification revealed a deviation of the {110} plane onto {111} crystallographic facets.

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