Liquid-Phase Electrochemical Scanning Electron Microscopy for In Situ Investigation of Lithium Dendrite Growth and Dissolution

2017 ◽  
Vol 29 (13) ◽  
pp. 1606187 ◽  
Author(s):  
Genlan Rong ◽  
Xinyi Zhang ◽  
Wen Zhao ◽  
Yongcai Qiu ◽  
Meinan Liu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Liquid Phase ◽  
Dendrite Growth ◽  
In Situ Investigation ◽  
Lithium Dendrite ◽  
Scanning Electron

scholarly journals In-Situ Observation for Formations of Gold Micrometer-Sized Particles in Liquid Phase Using Atmospheric Scanning Electron Microscopy (ASEM)

2018 ◽  
Vol 59 (1) ◽  
pp. 146-149 ◽  
Author(s):  
Yasunari Matsuno ◽  
Eri Okonogi ◽  
Akihiro Yoshimura ◽  
Mari Sato ◽  
Chikara Sato
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Liquid Phase ◽  
Scanning Electron

High-Resolution Resistance Mapping in SEM

2018 ◽  
Author(s):  
Grigore Moldovan ◽  
Wolfgang Joachimi ◽  
Guillaume Boetsch ◽  
Jörg Jatzkowski ◽  
Frank Altman
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Reference Structure ◽  
Total Resistance ◽  
Embedded Electronics ◽  
Improved Performance ◽  
Mapping Techniques ◽  
Scanning Electron

Abstract This work presents advanced resistance mapping techniques based on Scanning Electron Microscopy (SEM) with nanoprobing systems and the related embedded electronics. Focus is placed on recent advances to reduce noise and increase speed, such as integration of dedicated in situ electronics into the nanoprobing platform, as well as an important transition from current-sensitive to voltagesensitive amplification. We show that it is now possible to record resistance maps with a resistance sensitivity in the 10W range, even when the total resistance of the mapped structures is in the range of 100W. A reference structure is used to illustrate the improved performance, and a lowresistance failure case is presented as an example of analysis made possible by these developments.

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