scholarly journals 3D Atomic Force Microscopy: Three-Dimensional Atomic Force Microscopy - Taking Surface Imaging to the Next Level (Adv. Mater. 26-27/2010)

2010 ◽  
Vol 22 (26-27) ◽  
pp. n/a-n/a
Author(s):  
Mehmet Z. Baykara ◽  
Todd C. Schwendemann ◽  
Eric I. Altman ◽  
Udo D. Schwarz
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
Surface Imaging ◽  
Force Microscopy ◽  
Atomic Force

Three-Dimensional Atomic Force Microscopy - Taking Surface Imaging to the Next Level

2010 ◽  
Vol 22 (26-27) ◽  
pp. 2838-2853 ◽  
Author(s):  
Mehmet Z. Baykara ◽  
Todd C. Schwendemann ◽  
Eric I. Altman ◽  
Udo D. Schwarz
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
Surface Imaging ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Three-Dimensional Atomic Force Microscopy for Sidewall Imaging Using Torsional Resonance Mode

Scanning ◽  
2018 ◽  
Vol 2018 ◽  
pp. 1-8 ◽  
Author(s):  
Lu Liu ◽  
Jianguo Xu ◽  
Rui Zhang ◽  
Sen Wu ◽  
Xiaodong Hu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Three Dimensional ◽  
Resonance Mode ◽  
Surface Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
3D Topography ◽  
Small Defect ◽  
Cantilever Probe

This article presents an atomic force microscopy (AFM) technique for true three-dimensional (3D) characterization. The cantilever probe with flared tip was used in a home-made 3D-AFM system. The cantilever was driven by two shaking piezoceramics and oscillated around its vertical or torsional resonance frequency. The vertical resonance mode was used for upper surface imaging, and the torsional resonance mode was used for sidewall detecting. The 3D-AFM was applied to measure standard gratings with the height of 100 nm and 200 nm. The experiment results showed that the presented 3D-AFM technique was able to detect the small defect features on the steep sidewall and to reconstruct the 3D topography of the measured structure.

scholarly journals Acoustic subsurface-atomic force microscopy: Three-dimensional imaging at the nanoscale

2021 ◽  
Vol 129 (3) ◽  
pp. 030901
Author(s):  
Hossein J. Sharahi ◽  
Mohsen Janmaleki ◽  
Laurene Tetard ◽  
Seonghwan Kim ◽  
Hamed Sadeghian ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
Three Dimensional Imaging ◽  
Force Microscopy ◽  
Atomic Force

Scratching the surface: Imaging interfacial structure using atomic force microscopy

Food Colloids ◽  
2007 ◽  
pp. 13-21 ◽  
Author(s):  
Alan R. Mackie ◽  
A. Patrick Gunning ◽  
Peter J. Wilde ◽  
Victor J. Morris
Keyword(s):  
Atomic Force Microscopy ◽  
Interfacial Structure ◽  
Surface Imaging ◽  
Force Microscopy ◽  
Atomic Force

Three-dimensional imaging of undercut and sidewall structures by atomic force microscopy

2011 ◽  
Vol 82 (2) ◽  
pp. 023707 ◽  
Author(s):  
Sang-Joon Cho ◽  
Byung-Woon Ahn ◽  
Joonhui Kim ◽  
Jung-Min Lee ◽  
Yueming Hua ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
Three Dimensional Imaging ◽  
Force Microscopy ◽  
Atomic Force
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