Photoresist-Free Lithographic Patterning of Solution-Processed Nanostructured Metal Thin Films

2008 ◽  
Vol 20 (18) ◽  
pp. 3457-3461 ◽  
Author(s):  
Hyunkwon Shin ◽  
Hyunjun Kim ◽  
Hyeongjae Lee ◽  
Hyeonggeun Yoo ◽  
Jinsoo Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Solution Processed ◽  
Metal Thin Films ◽  
Lithographic Patterning ◽  
Nanostructured Metal

Laser-Direct Patterning of Nanostructured Metal Thin Films

2010 ◽  
Vol 48 (2) ◽  
pp. 163-168 ◽  
Author(s):  
Hyunkwon Shin ◽  
Hyeongjae Lee ◽  
Hyeongjae Yoo ◽  
Ki-Soo Lim ◽  
Myeongkyu Lee
Keyword(s):  
Thin Films ◽  
Metal Thin Films ◽  
Direct Patterning ◽  
Nanostructured Metal

Observation and measurement of grain rotation and plastic strain in nanostructured metal thin films

1995 ◽  
Vol 5 (6) ◽  
pp. 689-697 ◽  
Author(s):  
M. Ke ◽  
S.A. Hackney ◽  
W.W. Milligan ◽  
E.C. Aifantis
Keyword(s):  
Thin Films ◽  
Plastic Strain ◽  
Metal Thin Films ◽  
Grain Rotation ◽  
Nanostructured Metal

Transmission Electron Microscopy studies of the vacancy ordering in YSI2-X thin films

1991 ◽  
Vol 49 ◽  
pp. 562-563
Author(s):  
F.-R. Chen ◽  
T. L. Lee ◽  
L. J. Chen
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Thin Films ◽  
Diffraction Pattern ◽  
Annealing Temperature ◽  
Lattice Mismatch ◽  
Si Substrate ◽  
Metal Thin Films ◽  
Transmission Electron ◽  
Vacancy Ordering

YSi2-x thin films were grown by depositing the yttrium metal thin films on (111)Si substrate followed by a rapid thermal annealing (RTA) at 450 to 1100°C. The x value of the YSi2-x films ranges from 0 to 0.3. The (0001) plane of the YSi2-x films have an ideal zero lattice mismatch relative to (111)Si surface lattice. The YSi2 has the hexagonal AlB2 crystal structure. The orientation relationship with Si was determined from the diffraction pattern shown in figure 1(a) to be and . The diffraction pattern in figure 1(a) was taken from a specimen annealed at 500°C for 15 second. As the annealing temperature was increased to 600°C, superlattice diffraction spots appear at position as seen in figure 1(b) which may be due to vacancy ordering in the YSi2-x films. The ordered vacancies in YSi2-x form a mesh in Si plane suggested by a LEED experiment.

Sulfur-Vacancy Passivation in Solution-Processed Sb2S3 Thin Films: Influence on Photovoltaic Interfaces

2019 ◽  
Vol 3 (1) ◽  
pp. 810-821 ◽  
Author(s):  
Abhishek Maiti ◽  
Soumyo Chatterjee ◽  
Amlan J. Pal
Keyword(s):  
Thin Films ◽  
Sulfur Vacancy ◽  
Solution Processed

scholarly journals Memory Devices: Solution‐Processed Stretchable Ag 2 S Semiconductor Thin Films for Wearable Self‐Powered Nonvolatile Memory (Adv. Mater. 23/2021)

2021 ◽  
Vol 33 (23) ◽  
pp. 2170181
Author(s):  
Seungki Jo ◽  
Soyoung Cho ◽  
U Jeong Yang ◽  
Gyeong‐Seok Hwang ◽  
Seongheon Baek ◽  
...  
Keyword(s):  
Thin Films ◽  
Nonvolatile Memory ◽  
Memory Devices ◽  
Solution Processed ◽  
Semiconductor Thin Films ◽  
Self Powered

Solution‐Processed Stretchable Ag 2 S Semiconductor Thin Films for Wearable Self‐Powered Nonvolatile Memory

2021 ◽  
pp. 2100066
Author(s):  
Seungki Jo ◽  
Soyoung Cho ◽  
U Jeong Yang ◽  
Gyeong‐Seok Hwang ◽  
Seongheon Baek ◽  
...  
Keyword(s):  
Thin Films ◽  
Nonvolatile Memory ◽  
Solution Processed ◽  
Semiconductor Thin Films ◽  
Self Powered

Solution‐Processed Large‐Scale Concentric‐Ring Laser on Two‐Dimensional Ruddlesden–Popper Perovskites Thin Films

2021 ◽  
pp. 2100193
Author(s):  
Peng Liu ◽  
Bingqian Zhang ◽  
Qing Liao ◽  
Guifen Tian ◽  
Chunling Gu ◽  
...  
Keyword(s):  
Thin Films ◽  
Ring Laser ◽  
Large Scale ◽  
Two Dimensional ◽  
Concentric Ring ◽  
Solution Processed

Solution processed transparent conductive hybrid thin films based on silver nanowires, zinc oxide and graphene

2021 ◽  
Vol 26 ◽  
pp. 102162
Author(s):  
Refik Arat ◽  
Guobin Jia ◽  
Jan Dellith ◽  
Andrea Dellith ◽  
Jonathan Plentz
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Silver Nanowires ◽  
Solution Processed ◽  
Hybrid Thin Films

Structuring of solution processed and thermally evaporated As33S67 thin films by soft stamp hot embossing method

2021 ◽  
Vol 559 ◽  
pp. 120674
Author(s):  
Michal Kurka ◽  
Karel Palka ◽  
Jiri Jancalek ◽  
Stanislav Slang ◽  
Miroslav Vlcek
Keyword(s):  
Thin Films ◽  
Hot Embossing ◽  
Solution Processed
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