Solvent Effects on Chain Orientation and Interchain π-Interaction in Conjugated Polymer Thin Films: Direct Measurements of the Air and Substrate Interfaces by Near-Edge X-ray Absorption Spectroscopy

2007 ◽  
Vol 19 (2) ◽  
pp. 215-221 ◽  
Author(s):  
P. K.-H. Ho ◽  
L.-L. Chua ◽  
M. Dipankar ◽  
X. Y. Gao ◽  
D. C. Qi ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Solvent Effects ◽  
Conjugated Polymer ◽  
Polymer Thin Films ◽  
Chain Orientation ◽  
X Ray ◽  
Direct Measurements ◽  
X Ray Absorption

scholarly journals X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Tin Oxide ◽  
Electron Mobility ◽  
Structural Disorder ◽  
Oxide Thin Films ◽  
X Ray ◽  
Zinc Tin Oxide ◽  
The Impact ◽  
X Ray Absorption

X-ray Absorption Spectroscopy Study of TiO2–x Thin Films for Memory Applications

2015 ◽  
Vol 119 (8) ◽  
pp. 4362-4370 ◽  
Author(s):  
D. Carta ◽  
G. Mountjoy ◽  
A. Regoutz ◽  
A. Khiat ◽  
A. Serb ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Memory Applications ◽  
X Ray Absorption

A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Noritake Isomura ◽  
Keiichiro Oh-ishi ◽  
Naoko Takahashi ◽  
Satoru Kosaka
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Absorption Spectroscopy ◽  
Electron Spectroscopy ◽  
Practical Method ◽  
Decay Length ◽  
Total Electron ◽  
X Ray ◽  
Logarithmic Equation ◽  
X Ray Absorption

Thin films formed on surfaces have a large impact on the properties of materials and devices. In this study, a method is proposed using X-ray absorption spectroscopy to derive the film thickness of a thin film formed on a substrate using the spectral separation and logarithmic equation, which is a modified version of the formula used in electron spectroscopy. In the equation, the decay length in X-ray absorption spectroscopy is longer than in electron spectroscopy due to a cascade of inelastic scattering of electrons generated in a solid. The modification factor, representing a multiple of the decay length, was experimentally determined using oxidized Si and Cu with films of thickness 19 nm and 39 nm, respectively. The validity of the proposed method was verified, and the results indicated that the method can be used in the analysis of various materials with thin films.

SnO2 thin films prepared by ion beam induced CVD: preparation and characterization by X-ray absorption spectroscopy

1999 ◽  
Vol 353 (1-2) ◽  
pp. 113-123 ◽  
Author(s):  
V.M. Jiménez ◽  
J.P. Espinós ◽  
A. Caballero ◽  
L. Contreras ◽  
A. Fernández ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Ion Beam ◽  
X Ray ◽  
Sno2 Thin Films ◽  
X Ray Absorption
Sign in / Sign up

Export Citation Format

Share Document