Thin Films: Sub-Micrometer Structure Formation during Spin Coating Revealed by Time-Resolved In Situ Laser and X-Ray Scattering (Adv. Funct. Mater. 46/2017)
Keyword(s):
X Ray
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2007 ◽
Vol 51
(92)
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pp. 862
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2012 ◽
Vol 544
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pp. 34-38
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