Quantitative analysis of lattice ordering in thin film opal-based photonic crystals

2008 ◽  
Vol 18 (17) ◽  
pp. 2471-2479 ◽  
Author(s):  
Worawut Khunsin ◽  
Gudrun Kocher ◽  
Sergei G. Romanov ◽  
Clivia M. Sotomayor Torres
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Photonic Crystals

Application of EDS Technique for OSP Film Thickness Measurement

2006 ◽  
Author(s):  
Prong Kongsubto ◽  
Sirarat Kongwudthiti
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Joint Strength ◽  
Critical Factor ◽  
Thickness Measurement ◽  
Ic Manufacturing ◽  
And Control ◽  
Film Thickness Measurement ◽  
Non Destructive

Abstract Organic solderability preservatives (OSPs) pad is one of the pad finishing technologies where Cu pad is coated with a thin film of an organic material to protect Cu from oxidation during storage and many processes in IC manufacturing. Thickness of OSP film is a critical factor that we have to consider and control in order to achieve desirable joint strength. Until now, no non-destructive technique has been proposed to measure OSP thickness on substrate. This paper reports about the development of EDS technique for estimating OSP thickness, starting with determination of the EDS parameter followed by establishing the correlation between C/Cu ratio and OSP thickness and, finally, evaluating the accuracy of the EDS technique for OSP thickness measurement. EDS quantitative analysis was proved that it can be utilized for OSP thickness estimation.

Thin Film 2-d Photonic Crystals High-Performance Light-Emitting Diodes

1999 ◽  
Author(s):  
Eli Yablonovitch ◽  
Misha Boroditsky ◽  
Rutger Vrijen ◽  
Thomas F. Krauss ◽  
Roberto Coccioli
Keyword(s):  
Thin Film ◽  
Photonic Crystals ◽  
High Performance ◽  
Light Emitting Diodes ◽  
Light Emitting

scholarly journals Absorbing photonic crystals for thin film photovoltaics

2010 ◽  
Author(s):  
O. El Daif ◽  
E. Drouard ◽  
G. Gomard ◽  
X. Meng ◽  
A. Kaminski ◽  
...  
Keyword(s):  
Thin Film ◽  
Photonic Crystals ◽  
Thin Film Photovoltaics

scholarly journals Thin‐film hermeticity: A quantitative analysis of diamondlike carbon using variable angle spectroscopic ellipsometry

1988 ◽  
Vol 64 (8) ◽  
pp. 4175-4180 ◽  
Author(s):  
S. Orzeszko ◽  
Bhola N. De ◽  
John A. Woollam ◽  
John J. Pouch ◽  
Samuel A. Alterovitz ◽  
...  
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Spectroscopic Ellipsometry ◽  
Variable Angle ◽  
Diamondlike Carbon ◽  
Variable Angle Spectroscopic Ellipsometry

Integrating photonic crystals in thin film silicon photovoltaics

2010 ◽  
Author(s):  
P. G. O'Brien ◽  
A. Chutinan ◽  
G. A. Ozin ◽  
N. P. Kherani ◽  
S. Zukotynski
Keyword(s):  
Thin Film ◽  
Photonic Crystals ◽  
Thin Film Silicon ◽  
Silicon Photovoltaics

Compound Standards For Light Element Eds In Aem, Sem And Lvsem

1999 ◽  
Vol 5 (S2) ◽  
pp. 90-91
Author(s):  
E D Boyes
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Low Voltage ◽  
Light Element ◽  
Advanced Materials ◽  
Simple Extension ◽  
Light Elements ◽  
Stoichiometric Compound ◽  
Detector Sensitivity ◽  
Direct Light

For a number of years we have used in our laboratory a simple extension to light elements of the classical ClifF-Lorimer approach using stoichiometric compound standards containing pairs of heavier elements to determine independently the EDS detector sensitivity contribution to quantitative analysis in the AEM. It is now also extended to direct light element LVEDS analysis in the SEM at low voltage (<5kV). This approach may be more practical, accessible and easily reproducible for routine use than the elegant custom thin film fabrications reported by Egerton, but the latter method has other substantial advantages, including well defined thicknesses, in the most sophisticated applications. As the types of advanced materials have expanded to include ceramics and polymers the requirements for analysis have also changed. In many cases the light elements are now the majority species in advanced materials and the corrections based on older standards are huge; and therefore inevitably rather limited in accuracy.

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