Internal Oxidation Prediction by Cellular Automata Approach in Energy Materials at High Temperatures

2019 ◽  
Vol 21 (7) ◽  
pp. 1801142
Author(s):  
Tomasz Pawel Dudziak ◽  
Katrin Jahns ◽  
Dorota Wilk Kołodziejczyk ◽  
Ulrich Krupp ◽  
Adelajda Polkowska ◽  
...  
Keyword(s):  
Cellular Automata ◽  
High Temperatures ◽  
Internal Oxidation ◽  
Energy Materials

Internal Oxidation Depth Penetration in Ni-Based Alloys at High Temperatures

CORROSION ◽  
10.5006/2964 ◽  
2018 ◽  
Vol 75 (2) ◽  
pp. 192-202
Author(s):  
Tomasz Dudziak ◽  
Magdalena Ziąbka
Keyword(s):  
High Temperatures ◽  
Internal Oxidation ◽  
Oxidation Depth

Numerical Analysis of Internal Oxidation and Nitridation by the Cellular Automata Approach

2013 ◽  
Vol 79 (1-2) ◽  
pp. 107-120 ◽  
Author(s):  
Katrin Jahns ◽  
Martin Landwehr ◽  
Jürgen Wübbelmann ◽  
Ulrich Krupp
Keyword(s):  
Numerical Analysis ◽  
Cellular Automata ◽  
Internal Oxidation

In situ REM imaging of surface processes on ceramic bulk crystals from 300 to 1670 K in a conventional TEM

1991 ◽  
Vol 49 ◽  
pp. 660-661
Author(s):  
Z. L. Wang ◽  
J. Bentley
Keyword(s):  
High Temperatures ◽  
Image Resolution ◽  
Atomic Processes ◽  
Crystal Surfaces ◽  
Beam Radiation ◽  
Surface Areas ◽  
Transmission Electron ◽  
Reflection Electron Microscopy ◽  
Gas Reactions

Studying the behavior of surfaces at high temperatures is of great importance for understanding the properties of ceramics and associated surface-gas reactions. Atomic processes occurring on bulk crystal surfaces at high temperatures can be recorded by reflection electron microscopy (REM) in a conventional transmission electron microscope (TEM) with relatively high resolution, because REM is especially sensitive to atomic-height steps.Improved REM image resolution with a FEG: Cleaved surfaces of a-alumina (012) exhibit atomic flatness with steps of height about 5 Å, determined by reference to a screw (or near screw) dislocation with a presumed Burgers vector of b = (1/3)<012> (see Fig. 1). Steps of heights less than about 0.8 Å can be clearly resolved only with a field emission gun (FEG) (Fig. 2). The small steps are formed by the surface oscillating between the closely packed O and Al stacking layers. The bands of dark contrast (Fig. 2b) are the result of beam radiation damage to surface areas initially terminated with O ions.

Sign in / Sign up

Export Citation Format

Share Document