Processing and Characterization of Aluminum Nitride Ceramics for High Thermal Conductivity

2014 ◽  
Vol 16 (6) ◽  
pp. 655-669 ◽  
Author(s):  
Hyun Min Lee ◽  
Kamala Bharathi ◽  
Do Kyung Kim
Keyword(s):  
Thermal Conductivity ◽  
Aluminum Nitride ◽  
High Thermal Conductivity ◽  
Nitride Ceramics

High-Thermal-Conductivity Aluminum Nitride Ceramics: The Effect of Thermodynamic, Kinetic, and Microstructural Factors

2005 ◽  
Vol 80 (6) ◽  
pp. 1421-1435 ◽  
Author(s):  
T. Barrett Jackson ◽  
Anil V. Virkar ◽  
Karren L. More ◽  
Ralph B. Dinwiddie ◽  
Raymond A. Cutler
Keyword(s):  
Thermal Conductivity ◽  
Aluminum Nitride ◽  
High Thermal Conductivity ◽  
Nitride Ceramics

CBED analysis of impurity distributions in AlN

1990 ◽  
Vol 48 (4) ◽  
pp. 214-215
Author(s):  
Daniel Callahan ◽  
G. Thomas
Keyword(s):  
Aluminum Nitride ◽  
Bulk Material ◽  
Strong Dependence ◽  
Lattice Parameter ◽  
Promising Technique ◽  
Nitride Ceramics ◽  
Surface Phases ◽  
Convergent Beam ◽  
Oxygen Impurities

Oxygen impurities may significantly influence the properties of nitride ceramics with a strong dependence on the microstructural distribution of the impurity. For example, amorphous oxygen-rich grain boundary phases are well-known to cause high-temperature mechanical strength degradation in silicon nitride whereas solutionized oxygen is known to decrease the thermal conductivity of aluminum nitride. Microanalytical characterization of these impurities by spectral methods in the AEM is complicated by reactions which form oxygen-rich surface phases not representative of the bulk material. Furthermore, the impurity concentrations found in higher quality ceramics may be too low to measure by EDS or PEELS. Consequently an alternate method for the characterization of impurities in these ceramics has been investigated.Convergent beam electron diffraction (CBED) is a promising technique for the study of impurity distributions in aluminum nitride ceramics. Oxygen is known to enter into stoichiometric solutions with AIN with a consequent decrease in lattice parameter.

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