Devices, Materials, and Processes for Nanoelectronics: Characterization with Advanced X-Ray Techniques Using Lab-Based and Synchrotron Radiation Sources

2011 ◽  
Vol 13 (8) ◽  
pp. 811-836 ◽  
Author(s):  
Ehrenfried Zschech ◽  
Christophe Wyon ◽  
Conal E. Murray ◽  
Gerd Schneider
Keyword(s):  
Synchrotron Radiation ◽  
X Ray ◽  
Radiation Sources

scholarly journals X‐ray monochromator system for use with synchrotron radiation sources

1981 ◽  
Vol 52 (4) ◽  
pp. 509-516 ◽  
Author(s):  
J. A. Golovchenko ◽  
R. A. Levesque ◽  
P. L. Cowan
Keyword(s):  
Synchrotron Radiation ◽  
X Ray ◽  
Radiation Sources

Machine Learning Powered by Principal Component Descriptors as the Key for Sorted Structural Fit of XANES

2021 ◽  
Author(s):  
Andrea Martini ◽  
Alexander A. Guda ◽  
Sergey A. Guda ◽  
Aram L. Bugaev ◽  
Olga V. Safonova ◽  
...  
Keyword(s):  
Machine Learning ◽  
Structural Analysis ◽  
Synchrotron Radiation ◽  
Free Electron Laser ◽  
Principal Component ◽  
Analytical Tool ◽  
X Ray ◽  
Radiation Sources ◽  
X Ray Absorption

Modern synchrotron radiation sources and free electron laser made X-ray absorption spectroscopy (XAS) an analytical tool for the structural analysis of materials under in situ or operando conditions. Fourier approach...

FREE-ELECTRON LASER SPECTROSCOPY OF SURFACES AND INTERFACES

1995 ◽  
Vol 02 (04) ◽  
pp. 501-512 ◽  
Author(s):  
N.H. TOLK ◽  
J.T. MCKINLEY ◽  
G. MARGARITONDO
Keyword(s):  
Synchrotron Radiation ◽  
Free Electron ◽  
Free Electron Laser ◽  
Interface Energy ◽  
Free Electron Lasers ◽  
Semiconductor Interface ◽  
X Ray ◽  
Surface And Interface ◽  
Surfaces And Interfaces ◽  
Radiation Sources

Synchrotron-radiation sources have become, since the late 1960’s, one of the fundamental experimental tools for surface and interface research. Only recently, however, a related type of photon sources - the free-electron lasers (FELs) — has begun to make important contributions to this field. For example, FELs have been used to reach unprecedented levels of accuracy and reliability in measuring semiconductor interface energy barriers. We review some of the present and proposed experiments that are made possible by the unmatched brightness and broad tunability of infrared FELs. Practical examples discussed in the review are supplied by our own programs at the Vanderbilt Free-Electron Laser. We also briefly analyze the possible future development of FELs and of their applications to surface and interface research, in particular, the possibility of x-ray FELs.

Microscopic X-ray Fluorescence Analysis with Synchrotron Radiation Sources

2011 ◽  
pp. 1737-1759 ◽  
Author(s):  
F. Adams ◽  
B. Vekemans ◽  
G. Silversmit ◽  
B. De Samber ◽  
L. Vincze
Keyword(s):  
Synchrotron Radiation ◽  
Fluorescence Analysis ◽  
X Ray ◽  
Radiation Sources
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